Sum frequency generation (SFG) spectroscopy is a powerful and versatile method for in-situ measurements of surfaces and interfaces. This method specifically detects signal contributions from a surface layer, yet not from the underlying bulk material of the sample. This explains the high sensitivity, which makes it possible to detect properties of even molecular monolayers on a surface with respect to type and orientation. But also dynamic processes like for example surface reaction on catalysers can be investigated using SFG spectroscopy. As you can see from our brochure (download below) a variety of applications have been stablished in the past few years. A SFG system consists principally of an excitation source (here: a Nd:YAG picosecond pump laser with tunable OPG), the detection system (monochromator, photomultiplier etc.) and a set of beam guiding and focusing optics as well as a sophisticated control and evaluation software.

Based on the long experience of our manufacturer EKSPLA in the field of SFG spectroscopy TOPAG offers complete SFG spectrometers incl. customer-specific solutions and comprehensive service. With single spectrometer components we support also researchers who need only partial solutions.

 

Contact us for your needs.