Ultrafast Transient Absorption Spectrometer HARPIA-TA

The HARPIA setup unifies multiple time-resolved spectroscopy capabilities, including femtosecond transient absorption and reflection, femtosecond fluorescence upconversion, hundred picoseconds-to-microsecond time-correlated single photon counting (TCSPC) and Raman scattering (FSRS) experiments. The modules HARPIA-TA, HARPIA-TB and HARPIA-TF can be combined and allow individual configurations for your specific application.

Description 

Features

  • 350 – 1100 nm probe wavelength range
  • Ample sample space to fit a cryostat or flow system
  • Beam monitoring and self‑recalibration
  • Simple integration of any user‑preferred external spectrograph
  • Transient absorption and Z-scan experiments on the same device

Applications

  • Photochemistry
  • Photobiology
  • Photophysics
  • Material science
  • Semiconductor physics
  • Time-resolved spectroscopy

Flexible Configuration

The HARPIA spectroscopy system can be extended with the modules HARPIA-TB and/or HARPIA-TF. For further information on possible configurations please see our layout drawings and our product page HARPIA-TF.

Overview

The popular transient absorption spectrometer HARPIA has been reimagined and redesigned to meet the needs and standards of today's scientific world. The new improved HARPIA offers a sleek and compact design and together with intuitive user experience and easy day-to-day maintenance. Adhering to the standards raised by the OPRHEUS line of devices, the entire spectroscopic system is now contained in a single monolithic aluminum casing that inherently ensures excellent optical stability and minimal optical path for the interacting beams. In contrast to its predecessor, the dimensions of the device are greatly reduced. The area was reduced roughly by 2.6x, whereas volume was reduced by nearly 4x. The new HARPIA can be easily integrated with both PHAROS / ORPHEUS and Ti:Sa / TOPAS laser systems. Just like its precursor, it features market leading characteristics such as 10-5 resolvable signals along with other unique properties such as the ability to work at high repetition rates (up to 1 MHz) when used with PHAROS / ORPHEUS system. The high repetition rate allows measuring transient absorption dynamics while exciting the samples with extremely low pulse energies (thereby avoiding exciton annihilation effects in energy transferring systems or nonlinear carrier recombination in semiconductor/nanoparticle samples).

A number of probe configurations and detection options are available starting with simple and cost-effective photodiodes for single wavelength detection and ending with spectrally-resolved broadband detection combined with white light continuum probing. Data acquisition and measurement control are now integrated within the device itself and offer such improved detection capabilities as:

  • Single (sample-only) or multiple (sample and reference) integrated spectral detectors
  • Simple integration of any user-preferred external spectrograph
  • Beam monitoring and self-recalibration capabilities (both along the optical path of the pump/probe beams and at the sample plane) and an option for automated beam readjustment
  • Straightforward switching between transient absorption or transient reflection measurements
  • Capability to combine both transient absorption and Z-scan experiments on the same device

Moreover, different delay line options can be selected to cover delay windows from 2 ns to 8 ns and HARPIA may house either standard linear leadscrew (20 mm/s) or fast ball-screw (300 mm/s) optical delay stages.

A number of optomechanical peripherals are now compactly enclosed in the HARPIA casing, including:

  • An optical chopper that can either phase-lock itself to any multiple of the frequency of the laser system or operate in a free-running internally-referenced regime (standard)
  • Motorized and calibrated Berek’s polarization compensator that can automatically adjust the polarization of the pump beam (optional)
  • Motorized transversely translatable supercontinuum generator (applicable for safe and stable supercontinuum generation in materials such as CaF2 or MgF2; optional)
  • Automated sample raster scanner that translates the sample in the focal plane of the pump and probe beams, thus avoiding local sample overexposure (optional)

Moreover, the new HARPIA is designed to be compatible with any user-favored cryostat and/or peristaltic pump system (see mounting sheme). Capabilities of the new HARPIA can be further extended by introducing a third beam to the sample plane, thus allowing the user to perform multi-pulse transient absorption measurements. In addition to experiment automation software, HARPIA includes the data analysis package CarpetView for inspecting the acquired data and performing global and target analysis, probe dispersion compensation, exponential fitting etc. The software package features an intuitive and user friendly interface; it is delivered with a data analysis tutorial that offers seamless transition from the raw data to publication quality graphs and model based parameter estimation. All the software runs under MS Windows and it is easy to use. Even a novice will become an analysis expert in a matter of days!

Specifications 
Model Harpia-TA
Pump-probe specifications
Probe wavelength range supported by the optics 240 – 2600 nm
Probe wavelength range, white light supercontinuum generator, pumped by 1030 nm 350 – 750 nm, 480 – 1100 nm
Probe wavelength range, white light supercontinuum generator, pumped by 800 nm 350 – 1100 nm
Probe wavelength range of the detectors 200 nm – 1100 nm, 700 nm – 1800 nm, 1.2 μm – 2.6 μm
Spectral range of the spectral devices 180 nm – 24 μm, achievable with interchangeable gratings
Delay range 4 ns, 6 ns, 8 ns
Delay resolution 4.17 fs, 6.25 fs, 8.33 fs
Laser repetition rate 1 – 1000 kHz (digitizer frequency <2 khz
Time resolution <1.4 x the the pump or probe pulse duration (whichever is longer)
Dimensions (W x L x H)1) 420 x 730 x 183 mm

 

1) Without external spectrograph

Options 

Features

  • Extends the capabilities of the HARPIA‑TA system
  • Can be installed as an add-on to an already existing HARPIA‑TA mainframe basis
  • Provides an additional dimension to pump‑probe measurements
  • Provides additional insight to complex photodynamic systems
  • Full control of the third beam:
    • Polarization (manual or automated Berek variable waveplate in the third beam path)
    • Intensity (continuously variable neutral density filters in the third beam path with automated version available)
    • Delay (the auxiliary laser pulse is delayed in an optical delay line with full delay ranging from 1.3 to 2.6 ns)
  • Data analysis software for inspecting the acquired multi‑pulse data and performing global and target analysis

When standard spectroscopic techniques are not enough to unravel the intricate ultrafast dynamics of photoactive systems, multi-pulse time-resolved spectroscopic techniques can be utilized to shed additional insight. HARPIA‑TB is a third beam delivery unit for the HARPIA‑TA mainframe system that adds an additional dimension to typical time resolved absorption measurements. A temporally delayed auxiliary (third) laser pulse, as depicted below, can be applied to a typical pump-probe configuration in order to perturb the on-going pump-induced photodynamics.

An auxiliary pulse resonant to a stimulated emission transition band can deliberately depopulate the excited state species and thereby revert the excited system back to the ground state potential energy surface. This type of experiment is usually referred to as pump-dump-probe (PDP).

When the wavelength of the third pulse corresponds to an induced absorption resonance, the pulse is thus able to elevate the system to a higher excited state (that may or may not be detectable in the standard photoevolution) or return it to an earlier evolutionary transient. This type of measurement is typically referred to as pump-repump-probe (PrPP).

When the auxiliary pulse is resonant to an electronic ground-to-excited state transition, i.e., S0 to Sn, it makes it possible to either “replenish” the excited state population or to prepare a small portion of excited state population before the “main” pump pulse. This type of measurement is typically referred to as prepump-pump-probe (pPPP).

Since both probe and the auxiliary pulse can be delayed in time with respect to one another, both kinetic trace and action trace experiments can be performed with a HARPIA‑TB setup. In other words, we can obtain either the information on how a perturbation disturbs the standard photodynamic behavior of the investigated system (when the probe pulse is propagated in time), or we can monitor how the exact timing of perturbation influences the transient absorption spectrum at a fixed evolutionary phase system (when the auxiliary pulse is propagated in time).

Moreover, HARPIA‑TB can be utilized to deliver frequency-narrowed (i.e., picosecond) pulses, thus providing the capability to perform time-resolved femtosecond stimulated Raman scattering (FSRS) spectroscopic measurements.

Documents 
Inquiry 
Do you have questions about HARPIA-TA?
Your details will be gathered and handled to respond to your request.
Detailed information on this topic can be retrieved from our privacy policy.
  • Description
  • Specifications
  • Options
  • Pictures
  • Documents
  • Inquiry

Features

  • 350 – 1100 nm probe wavelength range
  • Ample sample space to fit a cryostat or flow system
  • Beam monitoring and self‑recalibration
  • Simple integration of any user‑preferred external spectrograph
  • Transient absorption and Z-scan experiments on the same device

Applications

  • Photochemistry
  • Photobiology
  • Photophysics
  • Material science
  • Semiconductor physics
  • Time-resolved spectroscopy

Flexible Configuration

The HARPIA spectroscopy system can be extended with the modules HARPIA-TB and/or HARPIA-TF. For further information on possible configurations please see our layout drawings and our product page HARPIA-TF.

Overview

The popular transient absorption spectrometer HARPIA has been reimagined and redesigned to meet the needs and standards of today's scientific world. The new improved HARPIA offers a sleek and compact design and together with intuitive user experience and easy day-to-day maintenance. Adhering to the standards raised by the OPRHEUS line of devices, the entire spectroscopic system is now contained in a single monolithic aluminum casing that inherently ensures excellent optical stability and minimal optical path for the interacting beams. In contrast to its predecessor, the dimensions of the device are greatly reduced. The area was reduced roughly by 2.6x, whereas volume was reduced by nearly 4x. The new HARPIA can be easily integrated with both PHAROS / ORPHEUS and Ti:Sa / TOPAS laser systems. Just like its precursor, it features market leading characteristics such as 10-5 resolvable signals along with other unique properties such as the ability to work at high repetition rates (up to 1 MHz) when used with PHAROS / ORPHEUS system. The high repetition rate allows measuring transient absorption dynamics while exciting the samples with extremely low pulse energies (thereby avoiding exciton annihilation effects in energy transferring systems or nonlinear carrier recombination in semiconductor/nanoparticle samples).

A number of probe configurations and detection options are available starting with simple and cost-effective photodiodes for single wavelength detection and ending with spectrally-resolved broadband detection combined with white light continuum probing. Data acquisition and measurement control are now integrated within the device itself and offer such improved detection capabilities as:

  • Single (sample-only) or multiple (sample and reference) integrated spectral detectors
  • Simple integration of any user-preferred external spectrograph
  • Beam monitoring and self-recalibration capabilities (both along the optical path of the pump/probe beams and at the sample plane) and an option for automated beam readjustment
  • Straightforward switching between transient absorption or transient reflection measurements
  • Capability to combine both transient absorption and Z-scan experiments on the same device

Moreover, different delay line options can be selected to cover delay windows from 2 ns to 8 ns and HARPIA may house either standard linear leadscrew (20 mm/s) or fast ball-screw (300 mm/s) optical delay stages.

A number of optomechanical peripherals are now compactly enclosed in the HARPIA casing, including:

  • An optical chopper that can either phase-lock itself to any multiple of the frequency of the laser system or operate in a free-running internally-referenced regime (standard)
  • Motorized and calibrated Berek’s polarization compensator that can automatically adjust the polarization of the pump beam (optional)
  • Motorized transversely translatable supercontinuum generator (applicable for safe and stable supercontinuum generation in materials such as CaF2 or MgF2; optional)
  • Automated sample raster scanner that translates the sample in the focal plane of the pump and probe beams, thus avoiding local sample overexposure (optional)

Moreover, the new HARPIA is designed to be compatible with any user-favored cryostat and/or peristaltic pump system (see mounting sheme). Capabilities of the new HARPIA can be further extended by introducing a third beam to the sample plane, thus allowing the user to perform multi-pulse transient absorption measurements. In addition to experiment automation software, HARPIA includes the data analysis package CarpetView for inspecting the acquired data and performing global and target analysis, probe dispersion compensation, exponential fitting etc. The software package features an intuitive and user friendly interface; it is delivered with a data analysis tutorial that offers seamless transition from the raw data to publication quality graphs and model based parameter estimation. All the software runs under MS Windows and it is easy to use. Even a novice will become an analysis expert in a matter of days!

Model Harpia-TA
Pump-probe specifications
Probe wavelength range supported by the optics 240 – 2600 nm
Probe wavelength range, white light supercontinuum generator, pumped by 1030 nm 350 – 750 nm, 480 – 1100 nm
Probe wavelength range, white light supercontinuum generator, pumped by 800 nm 350 – 1100 nm
Probe wavelength range of the detectors 200 nm – 1100 nm, 700 nm – 1800 nm, 1.2 μm – 2.6 μm
Spectral range of the spectral devices 180 nm – 24 μm, achievable with interchangeable gratings
Delay range 4 ns, 6 ns, 8 ns
Delay resolution 4.17 fs, 6.25 fs, 8.33 fs
Laser repetition rate 1 – 1000 kHz (digitizer frequency <2 khz
Time resolution <1.4 x the the pump or probe pulse duration (whichever is longer)
Dimensions (W x L x H)1) 420 x 730 x 183 mm

1) Without external spectrograph

Features

  • Extends the capabilities of the HARPIA‑TA system
  • Can be installed as an add-on to an already existing HARPIA‑TA mainframe basis
  • Provides an additional dimension to pump‑probe measurements
  • Provides additional insight to complex photodynamic systems
  • Full control of the third beam:
    • Polarization (manual or automated Berek variable waveplate in the third beam path)
    • Intensity (continuously variable neutral density filters in the third beam path with automated version available)
    • Delay (the auxiliary laser pulse is delayed in an optical delay line with full delay ranging from 1.3 to 2.6 ns)
  • Data analysis software for inspecting the acquired multi‑pulse data and performing global and target analysis

When standard spectroscopic techniques are not enough to unravel the intricate ultrafast dynamics of photoactive systems, multi-pulse time-resolved spectroscopic techniques can be utilized to shed additional insight. HARPIA‑TB is a third beam delivery unit for the HARPIA‑TA mainframe system that adds an additional dimension to typical time resolved absorption measurements. A temporally delayed auxiliary (third) laser pulse, as depicted below, can be applied to a typical pump-probe configuration in order to perturb the on-going pump-induced photodynamics.

An auxiliary pulse resonant to a stimulated emission transition band can deliberately depopulate the excited state species and thereby revert the excited system back to the ground state potential energy surface. This type of experiment is usually referred to as pump-dump-probe (PDP).

When the wavelength of the third pulse corresponds to an induced absorption resonance, the pulse is thus able to elevate the system to a higher excited state (that may or may not be detectable in the standard photoevolution) or return it to an earlier evolutionary transient. This type of measurement is typically referred to as pump-repump-probe (PrPP).

When the auxiliary pulse is resonant to an electronic ground-to-excited state transition, i.e., S0 to Sn, it makes it possible to either “replenish” the excited state population or to prepare a small portion of excited state population before the “main” pump pulse. This type of measurement is typically referred to as prepump-pump-probe (pPPP).

Since both probe and the auxiliary pulse can be delayed in time with respect to one another, both kinetic trace and action trace experiments can be performed with a HARPIA‑TB setup. In other words, we can obtain either the information on how a perturbation disturbs the standard photodynamic behavior of the investigated system (when the probe pulse is propagated in time), or we can monitor how the exact timing of perturbation influences the transient absorption spectrum at a fixed evolutionary phase system (when the auxiliary pulse is propagated in time).

Moreover, HARPIA‑TB can be utilized to deliver frequency-narrowed (i.e., picosecond) pulses, thus providing the capability to perform time-resolved femtosecond stimulated Raman scattering (FSRS) spectroscopic measurements.

Do you have questions about HARPIA-TA?
Your details will be gathered and handled to respond to your request.
Detailed information on this topic can be retrieved from our privacy policy.

Do you have questions about our products?

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Give us a call | +49 6151 425978

TOPAG Lasertechnik GmbH
Nieder-Ramstädter Str. 247
64285 Darmstadt, Germany
Phone: +49 6151 4259 78
Fax: +49 6151 4259 88
E-mail: info@topag.de