SHR - Precise Echelle Wavemeter from UV to NIR

The SHR is an Echelle wavemeter with outstanding precision of ± 3 pm (1 : 30000) within a large wavelength range from 190 - 1100 nm. It is the ideal high-precision instrument for measuring laser wavelengths and linewidths. The SHR is fiber-coupled, does not contain any movable parts, is powered from USB and comes with a user-friendly software for measurement and online monitoring.

Description 

Features

  • High accuracy and wide spectral range
  • Capabilities of spectrum analysis
  • Can be used for pulsed and CW lasers
  • Compact design; no movable components
  • Optical fiber input coupled with an attenuator
  • User-friendly software

Applications

  • Measurement of laser wavelengths
  • Alignment and testing of lasers

The SHR is an ideal low-cost high-precision spectrometer for measuring laser wavelength in a large field of laser applications, as well as in the process of alignment and testing of solid-state lasers, diode lasers, dye lasers and OPOs.

The SHR optical scheme is based on an Echelle diffraction grating operating in high spectrum orders and a linear image sensor used as a detector. The SHR does not contain any moving elements; powering and control are performed from a computer via the Full-Speed USB interface. The SHR can be triggered from your laser source via standard TTL-level signals.

Laser beam is steered to the SHR entrance slit either via a multimode optical fiber fitted with a diffuse attenuator (both are included in the delivery set) or directly, without any fiber.

The SHR allows quick and easy measuring of absolute wavelength value of both CW and pulsed lasers with outstanding precision of ± 3 pm within a widest spectral range of 190-1100 nm, as well as detecting FWHM of the analysed line.

Apart from wavelength measuring the SHR provides demonstration of analysed spectra with resolution of 30000 (λ/Δλ<FWHM) which constitutes from 6pm for the UV spectrum range to 40pm for the NIR. The SHR also ensures on-line monitoring of the above values and spectra in the process of tuning the analysed wavelength.

In respect of wavelength resolution and accuracy the SHR is an alternative to a long-focus monochromator (focal length of more than 1000mm), equipped with an appropriate CCD. But unlike the monochromator, the SHR has no moving parts and provides real-time measurements without scanning of diffraction grating. The SHR is rigid, stable and accurate, ensures absolute reliability and has more reasonable price.

The SHR wavelength meter is not directly intended for analysis of plasma emission and other populated spectra. However, the SHR can be applied in analysis of narrow spectral intervals within the spectral width of the Echelle order – from 0.5 nm in the UV spectrum range (190 nm) to 18nm in the IR (1200 nm), preliminarily separated with a filter or a monochromator. The High-Aperture Short-Focus monochromator ML44 can be used for this purpose.

Specifications 
Model 1) SHR
Operation modes CW and pulsed (externally triggered)
Spectral range 190 - 1100 nm
Absolute accuracy ± 3 pm
Spectral resolution (instrument function, λ/ΔλFWHM) 30000 (from 6 pm at 193 nm to 40 pm at 1200 nm)
Source linewidth requirement, ≤ 125 cm-1 (from 0.5 nm at 193 nm to 18 nm at 1200 nm)
Sensitivity < 0.5 µW at 632.8 nm for min exposure time of 7 ms
Optical interface a optical fiber 400 µm dia, 1 m length, connector SMA-905
Optical interface b diffuse attenuator FA-3 equipped with SMA-905
Computer interface USB

1) For more detailed specifications, please download the product datasheet.

Documents 
Inquiry 
Do you have questions about SHR?
Your details will be gathered and handled to respond to your request.
Detailed information on this topic can be retrieved from our privacy policy.
  • Description
  • Specifications
  • Documents
  • Inquiry

Features

  • High accuracy and wide spectral range
  • Capabilities of spectrum analysis
  • Can be used for pulsed and CW lasers
  • Compact design; no movable components
  • Optical fiber input coupled with an attenuator
  • User-friendly software

Applications

  • Measurement of laser wavelengths
  • Alignment and testing of lasers

The SHR is an ideal low-cost high-precision spectrometer for measuring laser wavelength in a large field of laser applications, as well as in the process of alignment and testing of solid-state lasers, diode lasers, dye lasers and OPOs.

The SHR optical scheme is based on an Echelle diffraction grating operating in high spectrum orders and a linear image sensor used as a detector. The SHR does not contain any moving elements; powering and control are performed from a computer via the Full-Speed USB interface. The SHR can be triggered from your laser source via standard TTL-level signals.

Laser beam is steered to the SHR entrance slit either via a multimode optical fiber fitted with a diffuse attenuator (both are included in the delivery set) or directly, without any fiber.

The SHR allows quick and easy measuring of absolute wavelength value of both CW and pulsed lasers with outstanding precision of ± 3 pm within a widest spectral range of 190-1100 nm, as well as detecting FWHM of the analysed line.

Apart from wavelength measuring the SHR provides demonstration of analysed spectra with resolution of 30000 (λ/Δλ<FWHM) which constitutes from 6pm for the UV spectrum range to 40pm for the NIR. The SHR also ensures on-line monitoring of the above values and spectra in the process of tuning the analysed wavelength.

In respect of wavelength resolution and accuracy the SHR is an alternative to a long-focus monochromator (focal length of more than 1000mm), equipped with an appropriate CCD. But unlike the monochromator, the SHR has no moving parts and provides real-time measurements without scanning of diffraction grating. The SHR is rigid, stable and accurate, ensures absolute reliability and has more reasonable price.

The SHR wavelength meter is not directly intended for analysis of plasma emission and other populated spectra. However, the SHR can be applied in analysis of narrow spectral intervals within the spectral width of the Echelle order – from 0.5 nm in the UV spectrum range (190 nm) to 18nm in the IR (1200 nm), preliminarily separated with a filter or a monochromator. The High-Aperture Short-Focus monochromator ML44 can be used for this purpose.

Model 1) SHR
Operation modes CW and pulsed (externally triggered)
Spectral range 190 - 1100 nm
Absolute accuracy ± 3 pm
Spectral resolution (instrument function, λ/ΔλFWHM) 30000 (from 6 pm at 193 nm to 40 pm at 1200 nm)
Source linewidth requirement, ≤ 125 cm-1 (from 0.5 nm at 193 nm to 18 nm at 1200 nm)
Sensitivity < 0.5 µW at 632.8 nm for min exposure time of 7 ms
Optical interface a optical fiber 400 µm dia, 1 m length, connector SMA-905
Optical interface b diffuse attenuator FA-3 equipped with SMA-905
Computer interface USB

1) For more detailed specifications, please download the product datasheet.

Do you have questions about SHR?
Your details will be gathered and handled to respond to your request.
Detailed information on this topic can be retrieved from our privacy policy.

Do you have questions about our products?

Write to us | info@topag.de

Give us a call | +49 6151 42944 0

TOPAG Lasertechnik GmbH
Nieder-Ramstädter Str. 247
64285 Darmstadt, Germany
Phone: +49 6151 42944 0
Fax: +49 6151 42944 11
E-mail: info@topag.de